IEC Equipment Reliability Testing – Part 4: Statistical Procedures for Exponential Distribution – Point Estimates, Confidence Intervals, Prediction. Buy IEC EQUIPMENT RELIABILITY TESTING – PART 4: STATISTICAL PROCEDURES FOR EXPONENTIAL DISTRIBUTION – POINT ESTIMATES. Buy IEC Ed. Equipment reliability testing Part 4: Statistical procedures for exponential distribution – Point estimates, confidence intervals, prediction.
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Equipment for portable and no-stationary use — Low degree of simulation. Application guide-Integrated logistic support. Describes implementation of a maintainability program. Describes numerical methods for performing a Weibull goodness of fit test for two-parameter Weibull distribution using maximum likelihood methods.
Describes dependability elements and tasks for systems or products containing software. The main changes with respect to the previous edition are as follows: Describes statistical methods for evaluating point estimates, confidence intervals, prediction intervals, and tolerance intervals for the failure rate of items whose time to failure follows and exponential distribution.
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Outdoor transportable equipment — Low degree of simulation. Please first verify your email before subscribing to alerts.
Essai de fiabilite des equipements. Characteristics and design of machines, apparatus, equipment Including reliability, dependability, maintainability, durability, etc.
Return to top of page. Verification and collection, analysis and presentation of data. Find Similar Items This product falls into the following categories. This website is best viewed with browser version of up to Microsoft Internet Explorer 8 or Firefox 3.
Describes preferred test conditions as give in Ieec Equipment for stationary use in partially weather protected locations — Low degree of simulation. Application guide- Section 9: Subscription pricing is determined by: Proceed to Checkout Continue Shopping.
This document was withdrawn in and replace by IEC for Reliability stress screening-Part 1: This standard is also available to be included in Standards Subscriptions. Accept and continue Learn more about the cookies we use and how to change your settings. Reliability and dependability standards provide quick guides for reliability details. Application guide- Reliability test conditions and statistical test principles.
BS IEC 60605-4:2001
We have no ied or corrections for this standard. Describes aspects of verification necessary to ensure that the specified maintainability requirements of an item have been met and provides suitable procedures and test methods. Add to Alert PDF. This standard provides guidance for the collection and presentation of data relating to the reliability of electronic components and their reliability characteristics.
Search all products by. Guidelines for dependability management.
You may find similar items within these categories by selecting from the choices below:. Describes processes which are applicable for hardware items which have unacceptably low reliability in the early failure periods and when other methods such as reliability grow plots are not applicable.
“Reliabilty and dependability standards are described.”
Indoor portable equipment-Low degree of simulation. Software aspects of dependability. PERD publications are available for sale and download.
This standard is applicable whenever data on strength parameters, e. Pre-exposure tests may in some cases be necessary before commencing the test cycles designed by the methods of this standard.
Life cycle models are used to describe product development or project phases. There are several reliability 6605 models available, the power law model being one of the most widely used. Describes development of a preventive maintenance program using RCM techniques. You may experience issues viewing this site in Internet Explorer 9, 10 or Describes procedures to estimate the parameters of the power law model along with confidence intervals for failure intensity, and prediction intervals for the time to future failures along with a test of goodness of fit to data from repaired items.